Universidad Politécnica de Madrid

Instituto de energía solar

Infrastructure details

 

1. Photoreflectance
    • Specifications according to ISO9001 (I-18-05)
    • Type of materials: Semiconductors
    • Metallization: NO
    • Thickness: <10mm
    • Size <0.5cmx0.5cm
    • Range of measurement: 400nm-2500nm
2. Quantum efficiency
    • Specifications according to ISO9001 (I-18-05)
    • Type of materials : 2 terminal Semiconductor Devices
    • Metallization: YES (grid)
    • Thickness: <5mm
    • Size <4cmx4cm
    • Range of measurement: 400nm-1700nm
    • Low Temperature Measurement Optional (see below)
3. Current-Voltage Characteristics
    • Specifications according to ISO9001 I-18-05
    • Type of materials : 2 terminal Semiconductor Devices
    • Metallization: YES
    • Thickness: <5mm
    • Size <1cmx1cm
    • Range of measurement: 100nA-1A
    • Low Temperature Measurement Optional (see below)
4. Concentration Measurements
    • Specifications according to ISO9001 I-18-05
    • Type of materials : 2 terminal Semiconductor Devices
    • Metallization: YES
    • Thickness: <5mm
    • Size <1cmx1cm
    • Range of measurement: 1uA-6A & 10ºC-50ºC
    • Low Temperature Measurement Optional (see below)
5. FTIR
    • Specifications according to ISO9001 I-18-05
    • Type of materials: semiconductors
    • Metallization: NO
    • Thickness: <5mm
    • Size >1cmx1cm
    • Range of measurement: 800nm-20000nm
6. Deep level Transient Spectroscopy (DLTS)
    • Specifications according to ISO9001 I-18-05
    • Type of materials: 2 terminal Semiconductor Devices
    • Metallization: YES
    • Thickness: <5mm
    • Size <1cm Ø
    • Range of measurement: 77K-330K
7. Photoluminiscence
    • Specifications according to ISO9001 I-18-05
    • Type of materials: semiconductors
    • Metallization: NO
    • Thickness: <5mm
    • Size >0.5cmx0.5cm
    • Range of measurement: 300nm-2000nm
8. Electroluminiscence
    • Specifications according to ISO9001 I-18-05
    • Type of materials: 2 terminal semiconductor Devices
    • Metallization: YES
    • Thickness: <5mm
    • Size < 0.5cmx0.5cm
    • Range of measurement: 300nm-2000nm

9. Profiler
    • Specifications according to ISO9001 I-18-05
    • Type of materials: non viscous materials
    • Metallization:--
    • Thickness: <30mm
    • Size <10cm Ø
    • Range of measurement: 1 Å-1.2 µm

10. Low Temperature Measurements
    • Our cryostats are able to be adapted to quantum efficiency, concentration and current-voltage measurements in order to test devices at low temperatures.
    • Specifications according to ISO9001 I-18-05
    • Type of materials: 2 terminal Semiconductor Devices
    • Metallization: YES
    • Thickness: <5mm
    • Size <1cm Ø
    • Range of measurement: 6K-298K
 
   
 
   
 
   
 
   
 
   
 
   
 

 

 

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