Instituto de energía solar

1. Characterization of PV materials and processes

• Diffractometer
• Inductively Coupled Photoconductance Decay lifetime tester. Sinton’s WTC-120 model. Measure of lifetime of minority carriers in p-type and n–type wafers. Sample sizes from 2” to 8”.
• Microwafe Photoconductance Decay lifetime tester. Semilab WT-2000, mapping lifetime on silicon wafers up to 8”. Also performs LBIC (Laser Beam Induced Current) measurements.
• Spectroscopic ellipsometer. HORIBA IBON JOVIN.  Characterization of thin films in the 190-850nm wavelength range with 2nm resolution.
• Four point probe. Sheet resistance and resistivity of a wide range of materials.
• FTIR. Fourier Transform Infrared Spectrometer to measure the absorption or emission of light at different wavelengths.  ThermoFischer. Measurement of the concentration of Oxygen and Carbon in Silicon.
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2. Characterization of solar cells

• Solar Simulator ORIEL SOL2A. 1000W Xe lamp. Sample Size: Max 6 x 6".Quantum Efficiency measurements. IQE-AC-XEN-EXT1. Spectral Range: 300 - 1800nm. Sample Size: Max 6 x 6".
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3. Reliability of PV devices

• Climatic chambers
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