Universidad Politécnica de Madrid Universidad Politécnica de Madrid

Characterization facilities for PV materials and cells



  • Material and process characterization: crystallographic analysis of thin single-crystal film III-V materials, concentration of impurities, lifetime, spectroscopy, sheet resistance and resistivity, wavelength resolved light absorption or emission,…

  • Device characterization: solar simulators, I-V curve measurement, spectral responsivity from 300 to 1840 nm, photoluminescence and electroluminescence spectroscopy, electroluminescence intensity mapping,…

  • Modeling of solar cells: 3D distributed model code for SPICE Software, and TCAD physics-based numerical modeling (2D and 3D Silvaco Software adapted for III-V single and multijunction solar cells).

  • Reliability and accelerated test of III-V solar cells: temperature accelerated life test.